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Investigation of gas pressure on metallic particle contaminationin 1-Ø gas insulated busduct

机译:气体压力对1-Ø气体绝缘管道中金属颗粒污染的影响研究

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SF6 gas has been adopted asan alternative of air for insulation technology in modern day industry due to its high dielectric strength and arc quenching properties. In the recent past, electrical substations are employing gas insulation because of its better properties and also lower space requirement. One of the major reasons for the failure of these gas insulated substations (GIS) is the particle contamination. The free metallic contaminating particles move in the gas insulated busducts by the influence of electric field and lead to the breakdown of the unit. The movement of these particles is governed by various factors and is primarily limited by the drag force which is a function of the pressure of the gas medium. The present work aims at investigating the impact of the SF6 gas pressure, inside the earthed metallic enclosures, on the metallic particle movement. Power frequency overvoltages generally employed for normal transmission are considered. Besides, the study is conducted on different dimensions of gas insulated busduct for better relevance. Wire type particles of commonly encountered contamination, aluminium and copper, with length 12mm and radius 0.25mm are considered to be present on the inner surface of the enclosure. The results show that the maximum displacement of the particles in the gas insulated busduct is independent of the gas pressure.
机译:SF6气体具有高介电强度和灭弧性能,因此在现代工业中已被用作绝缘技术的空气替代品。近年来,变电站因其更好的性能以及更低的空间需求而采用了气体绝缘。这些气体绝缘变电站(GIS)发生故障的主要原因之一是颗粒污染。游离的金属污染颗粒在电场的影响下在气体绝缘的母线中移动,并导致设备损坏。这些颗粒的运动受多种因素控制,并且主要受到作为气体介质压力的函数的阻力的限制。本工作旨在调查接地金属外壳内部的SF6气压对金属颗粒运动的影响。考虑通常用于正常传输的工频过电压。此外,为了更好的相关性,该研究针对不同尺寸的气体绝缘母线进行。外壳的内表面存在长度为12mm且半径为0.25mm的常见污染物铝和铜的线型颗粒。结果表明,气体绝缘的高架桥中颗粒的最大位移与气体压力无关。

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