Fast assessment method of major defects for LED luminaires

摘要

This paper introduces the failure modes and mechanism analysis of Light-emitting diode (LED) luminaires in the process of actual application, based on this, combined with the lifetime load information of LED luminaires, the sensitive stress of the main failure modes were carried out by the reliability analysis methods. By introduction of the notion of "major defects", we analyzed the failure modes of LED luminaires and study the fast assessment method of major defects assessment technology. The comparison analysis among the failure modes in actual working condition and obtained from the fast assessment method of major defects experiment, it is showed that the results are consistent. We analyzed the LED luminaires under experiment which does not fail at the end of the experiment, the results show that the lifetime of these samples can achieve at least 7000 hours which the reliability of lifetime is over 95%. The test results prove that the fast assessment method of major defects is an effective accelerated test method for evaluating LED luminaires reliability in short time.