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Studies on lead sulphide thin films deposited by photochemical method

机译:光化学法沉积硫化铅薄膜的研究

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Nanocrystalline lead sulphide (PbS) thin films were deposited on glass and ITO coated glass substrates by photochemical method. To improve the adhesive nature and properties the films were deposited on ITO coated substrate using photochemical deposition. The deposited films were characterized to study their structural, morphological and electrical properties. The photochemically deposited PbS thin films possess tetragonal system. The dislocation densities of the deposited thin films were evaluated from the X-ray diffraction data. High Resolution Scanning Electron Micrographs of the deposited film shows the oval shape arrangement of particles. The elemental composition of the film was confirmed by Energy Dispersive X-ray analysis. Hall measurements were carried out for the films and their electrical parameters were evaluated. The as-deposited PbS films have positive Hall coefficient, which confirms p-type conductivity.
机译:通过光化学方法将纳米晶硫化铅(PbS)薄膜沉积在玻璃和ITO涂覆的玻璃基板上。为了改善粘合性质和性能,使用光化学沉积将膜沉积在ITO涂覆的基材上。对沉积的膜进行表征以研究其结构,形态和电学性质。光化学沉积的PbS薄膜具有四方晶系。从X射线衍射数据评估沉积的薄膜的位错密度。沉积膜的高分辨率扫描电子显微照片显示了颗粒的椭圆形排列。膜的元素组成通过能量色散X射线分析确认。对膜进行霍尔测量,并评估其电参数。沉积的PbS薄膜具有正的霍尔系数,这证实了p型电导率。

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