Free-volume entities in thick-film nanostructures studied with PAL spectroscopy

摘要

Free-volume entities in so-called “free” thick-film structures based on spinel-type Cu0.1Ni0.8Co0.2Mn1.9O4 ceramics are studied for the first time using positron annihilation lifetime spectroscopy. It is shown that two-state positron trapping model is appropriate for an adequate description of changes caused by additional glass phase in these materials. The observed behaviour of defect-related component in the fit of the experimentally measured positron lifetime spectra for thick films in comparison with bulk ceramics testifies in a favour of agglomeration of free volume entities during technological process.