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Simulated annealing Vs. Genetic Simulated Annealing for automatic transistor sizing

机译:模拟退火Vs。遗传模拟退火,用于自动调整晶体管尺寸

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摘要

Transistor size optimization is an important aspect of circuit design. Small and non-complex circuits can be designed easily using manual calculations and circuit simulations. But, as the complexity of circuits increases, manual design becomes too difficult and time consuming. Therefore, tools and techniques for automatic transistor sizing are of great importance in the area of circuit design. The goal of this paper is to implement Genetic Simulated Annealing algorithm as a tool for transistor sizing, and compare its performance with Simulated Annealing, one of the most popular optimization algorithm in use today. The algorithms have been tested on four different digital circuits and the results collated and compared in this paper.
机译:晶体管尺寸的优化是电路设计的重要方面。使用手动计算和电路仿真可以轻松设计小型和非复杂电路。但是,随着电路复杂性的增加,手动设计变得太困难且耗时。因此,在电路设计领域中,用于自动调整晶体管尺寸的工具和技术非常重要。本文的目标是将遗传模拟退火算法实现为晶体管尺寸确定的工具,并将其性能与当今使用的最流行的优化算法之一的模拟退火进行比较。该算法已在四个不同的数字电路上进行了测试,结果在本文中进行了比较和比较。

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