Characterization of Si and CdTe sensor layers in Medipix assemblies using a microfocus x-ray source

摘要

Medipix2 assemblies with Si and CdTe sensors have been characterized using poly-energetic x-ray sources. This work reports the results of inhomogeneities within the sensors; individual pixel sensitivity response and their saturation effects at higher photon fluxes over one hundred frames. At higher tube currents saturation of both sensors is observed. We have performed correction for these inhomogeneities on both sensors. CT images with CdTe-Medipix2 are presented.