A Practical Noise Parameter Measurement Method of Packaged Low Noise Transistor

摘要

The key issue of packaged Low noise transistor noise parameter characterization is test fixture, this paper describes how to design test fixture and TRL cal standard based on PCB in detail, and also comprehensive verification of test fixture and TRL cal standard in frequency domain and time domain. What's more, this paper takes advantage of a new ultra-fast noise parameter measurement method with more simplicity, less test time and also more measurement accuracy.