Extraction of noise parameters of transistor using a spectrum analyser and 50 ohm sign noise figure measurements only

摘要

A method for measuring the four noise parameters of a transistor in the microwave range using a configuration based on a conventional spectrum analyser is presented. In contrast to previous methods, it requires wideband 50 /spl Theta/ noise-figure measurements only. The method features an accuracy similar to that of noise figure meters at a much higher measurement speed and lower cost.