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Vertical Channel Thin Film Transistor Technology: Similar Approach with 3D-ULSI Monolithic Technology

机译:垂直通道薄膜晶体管技术:与3D-ULSI单片技术相似的方法

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The previous thin film transistor studies involved planar process that means channel parallel to the substrate surface. Another way passes by a modification of the spatial geometry, more especially by the creation of vertical channels. This allows an increase of the equivalent current density flowing in the circuit thanks to two major modifications, the channel length that can be much shorter and the channel width that can be much higher, for the same design rules and for the same substrate area. The approach is thus similar to the recent evolution of the monolithic silicon technology. After the presentation of the interest of such vertical channel ways on both ULSI and thin film technologies, results on vertical TFTs are presented and discussed. We finally give comments on the common approaches between nano- and giga-electronics involving three dimensional geometry, in order to show that their basic scientific principles are roughly the same.
机译:先前的薄膜晶体管研究涉及平面工艺,这意味着沟道平行于衬底表面。另一种方式是修改空间几何形状,尤其是通过创建垂直通道。由于有两个主要的改进,对于相同的设计规则和相同的基板面积,这可以增加在电路中流动的等效电流密度,这可以是更短的沟道长度和更大的沟道宽度。因此,该方法类似于单片硅技术的最新发展。在展示了这种垂直通道方式对ULSI和薄膜技术的关注之后,将介绍和讨论垂直TFT的结果。最后,我们对涉及三维几何的纳米电子学和千兆电子学之间的通用方法进行评论,以表明它们的基本科学原理大致相同。

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