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3D integration process flow for set-top box application: description of technology and electrical results

机译:机顶盒应用程序的3D集成流程:技术和电气结果的描述

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In this paper, the technological steps specifically developed for 3D integration of a set top box demonstrator will be presented (figure 1). The integration flow is based on a 45nm node technology top chip stacked on a 130nm node technology active bottom wafer [1]. This flow needed to develop specific wafer level packaging technologies such as:rn1. Top & bottom chips interconnectionsrn2. Temporary bonding and debonding of bottom waferrn3. High aspect ratio TSV's designed into the bottom waferrn4. Backside interconnections for subsequent packaging steprn5. Top chip stacking on bottom waferrnIn this paper, the complete process flow will be presented. Then, a technical focus will be done on the most important process steps for the 3D integration. The preliminary electrical results of the demonstrator will be discussed. Finally, some prospects for 3D integration technologies and applications will be proposed.
机译:在本文中,将介绍专门为机顶盒演示器的3D集成开发的技术步骤(图1)。集成流程基于堆叠在130nm节点技术有源底部晶圆上的45nm节点技术顶部芯片[1]。此流程需要开发特定的晶圆级封装技术,例如:rn1。顶部和底部芯片互连rn2。底部晶圆的临时键合和分离3。高深宽比TSV设计在底部晶圆中4。背面互连以进行后续封装步骤5。顶部晶片堆叠在底部晶片上本文将介绍完整的工艺流程。然后,技术重点将放在3D集成的最重要的过程步骤上。将讨论演示器的初步电气结果。最后,将提出3D集成技术和应用的一些前景。

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