Millimeter-Wave Permittivity Measurements for Low-Loss Dielectric Materials using WG Mode Spherical Resonators

摘要

A new evaluating method for a low-loss dielectric material in a millimeter wave region is presented. In this technique, the relative permittivity and loss tangent value are calculated from the resonant frequencies and quality factors measured for the Whispering-gallery modes in the spherical dielectric resonator which consists of the dielectric material under test. In this paper, the measured results for a PTFE spherical sample in wide frequency band of 60 GHz to 100 GHz are shown.