【24h】

Aperture Extrapolation in Planar Near-field Measurement

机译:平面近场测量中的孔径外推

获取原文
获取原文并翻译 | 示例

摘要

The implementation of the planar-near-field technique necessitates the measurement on a truncated-plane surface. In some cases, the probe track and carriage of the near field equipment may not be able to provide sufficient range. To solve this problem, in this paper, the concept of the aperture extrapolation is introduced and verified. This extrapolation is carried out through the spectral estimation. The results show the good prospects in the application of the near-field measurement.
机译:平面近场技术的实施需要在截平面表面上进行测量。在某些情况下,近场设备的探测轨道和托架可能无法提供足够的距离。为了解决这个问题,本文引入并验证了孔径外推的概念。该推断是通过频谱估计进行的。结果表明该方法在近场测量中具有良好的应用前景。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号