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USE OF SCAN IMPEDANCE AND SCAN ELEMENT PATTERN

机译:扫描阻抗和扫描元素图案的使用

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摘要

Scan Impedance usually controls the bandwidth and matching capabilities of wideband arrays. But it is difficult to measure, as all elements must be properly excited. Scan Element Pattern, whether measured on transmit with one element excited, or on receive, always yields relative scan performance, and frequency squared behavior. On transmit the driven element impedance is benign, but it is not Scan Impedance. On receive the impedance is Scan Impedance, but it is difficult to measure. Computer simulations are used to elucidate these characteristics.
机译:扫描阻抗通常控制宽带阵列的带宽和匹配能力。但是很难测量,因为必须适当激发所有元素。扫描元素模式,无论是在激发一个元素的发射状态下还是在接收状态下进行测量,总是会产生相对的扫描性能和频率平方行为。传输时,从动元件的阻抗是良性的,但不是扫描阻抗。接收时的阻抗为扫描阻抗,但很难测量。使用计算机仿真来阐明这些特征。

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