MMIC CHARACTERIZATION USING ELECTRO-OPTIC FIELD MAPPING

摘要

It has been demonstrated recently that the technique of direct electro-optic probing can successfully be applied to study two-dimensional electric field distributions in MMICs. As a result, each MMIC component can be characterized by on-wafer and in-circuit measurements up to millimeter wave frequencies. In this paper, experimental results performed on a traveling-wave amplifier are presented as an example. Furtheron, different MMIC components are tested in detail and a quantitative comparison with theoretical results is carried out.