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Optical Limitations to Cell Size Reduction in IT-CCD Image Sensors

机译:IT-CCD图像传感器中减小像元尺寸的光学限制

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摘要

We have determined the practical limits of cell size reduction in interline-transfer CCD image sensors, limits resulting from diffraction occurring at the aperture above the photodiode. We have found that image cell size cannot be reduced to a level for which aperture width would fall below about 0.2 μm. We have also found, however, that image cells with greater than 0.2 μm aperture size are sensitive over the entire wavelength range of visible light, and that sensitivity can be increased by thinning the photoshield film.
机译:我们已经确定了行间转移CCD图像传感器中减小单元尺寸的实际限制,这些限制是由于在光电二极管上方的孔径处发生衍射而引起的。我们已经发现,图像单元尺寸不能减小到孔径宽度将下降到低于约0.2μm的水平。但是,我们还发现,孔径大于0.2μm的图像单元在可见光的整个波长范围内都是敏感的,并且可以通过减薄光屏蔽膜来提高敏感度。

著录项

  • 来源
  • 会议地点 Washington DC(US);Washington DC(US)
  • 作者单位

    Microelectronics Research Labs. NEC Corporation 1120 Shimokuzawa, Sagamihara, Kanagawa 229, Japan;

    Microelectronics Research Labs. NEC Corporation 1120 Shimokuzawa, Sagamihara, Kanagawa 229, Japan;

    ULSI Device Development Labs. NEC Corporation 1120 Shimokuzawa, Sagamihara, Kanagawa 229, Japan;

    Microelectronics Research Labs. NEC Corporation 1120 Shimokuzawa, Sagamihara, Kanagawa 229, Japan;

    Microelectronics Research Labs. NEC Corporation 1120 Shimokuzawa, Sagamihara, Kanagawa 229, Japan;

    ULSI Device Development Labs. NEC Corporation 1120 Shimokuzawa, Sagamihara, Kanagawa 229, Japan;

    ULSI Device Development Labs. NEC Corporation 1120 Shimokuzawa, Sagamihara, Kanagawa 229, Japan;

    Microelectronics Research Labs. NEC Corporation 1120 Shimokuzawa, Sagamihara, Kanagawa 229, Japan;

    ULSI Device Developmen;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 电子元件、组件;
  • 关键词

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