RELIABILITY ISSUES FOR DESIGN AND TEST OF COMPLEX INTEGRATED CIRCUITS

摘要

One of the functions of the FAA Technical Center's Digital Systems Validation program is to educate FAA certification engineers in new technologies. This paper introduces the topic, Complex Integrated Circuits, along with some of the certification risks associated with this technology. This work is a partial summary of a technical report prepared for the FAA Technical Center's Airport and Aircraft Safety R&D Branch, Flight Safety Research Section. This paper seeks to highlight some of the problems associated with complex digital hardware used in digital flight control and avionic systems.