首页> 外文会议>13th International Vacuum Microelectronics Conference(IVMC 2000) >The New Method about Nondestructive Internal Microtomography to Semiconductors and IC

【24h】

The New Method about Nondestructive Internal Microtomography to Semiconductors and IC

机译：半导体和集成电路无损内部显微照相的新方法

获取原文

获取原文并翻译 | 示例

页面导航

著录项
相似文献
相关主题

著录项

来源
《13th International Vacuum Microelectronics Conference(IVMC 2000) 》|2000年|75-76|共2页
会议地点 Guangzhou(CN)
作者

展开▼
作者单位

展开▼
会议组织
原文格式 PDF
正文语种 eng
中图分类
关键词

相似文献

外文文献
中文文献
专利

1. Nondestructive imaging of the internal microstructure of vessels and nerve fibers in rat spinal cord using phase-contrast synchrotron radiation microtomography [J] . Hu Jianzhong, Li Ping, Yin Xianzhen, Journal of synchrotron radiation . 2017 ,第2期

机译：相对造影同步辐射微微映射微型摄像头脊髓血管内部微观结构的无损成像
2. Effectiveness of Nondestructive Methods for the Evaluation of Structures Affected by Internal Swelling Reactions: A Review of Electric, Seismic and Acoustic Methods Based on Laboratory and Site Experiences [J] . Metalssi O. Omikrine, Godart B., Toutlemonde F. Experimental Techniques . 2015 ,第2期

机译：非破坏性方法对内部膨胀反应影响的结构进行评估的有效性：基于实验室和现场经验的电，地震和声学方法的回顾
3. Modern Methods and Means for Nondestructive Testing of the Quality of Power Semiconductor Devices [J] . V. Ya. Khorolskii, A. B. Ershov, A. V. Efanov Russian electrical engineering . 2016 ,第7期

机译：功率半导体器件质量的无损检测的现代方法和手段
4. A new method for nonestructive internal microtomography of semiconductors and IC [C] . Ling Xiao, Yawen Li, Zhuguan Liang, Proceedings of International Kunming Symposium on Microscopy July 2-5, 2000 Kunming, Yunnan Province, China . 2000

机译：半导体和IC无损内部显微照相的新方法
5. Development of X-ray phase contrast and microtomography methods for the three-dimensional study of fatigue cracks. [D] . Ignatiev, Konstantin I. 2004

机译：X射线相衬和显微断层照相法在疲劳裂纹三维研究中的发展。
6. A Nondestructive Method to Distinguish the Internal Constituent Architecture of the Intervertebral Discs Using 9.4 Tesla Magnetic Resonance Imaging [O] . Vithanage N. Wijayathunga, John P. Ridgway, Eileen Ingham, -1

机译：使用9.4 Tesla磁共振成像区分椎间盘内部成分的非破坏性方法
7. Nondestructive Internal Observation with High Resolution Using Metal-Oxide-Semiconductor LSI Chip as a Specimen [O] . Kobayashi Mutsuo, Takenoshita Hiroshi, Okuda Masahiro 1996

机译：使用金属氧化物半导体LSI芯片作为标本的高分辨率无损内部观察
8. Research and Development of NMR Methods for the Nondestructive Characterization of Internal Stress and Strain in Nonferromagnetic Structural Materials [R] . Matzkanin, G. A. 1979

机译：非磁性结构材料内应力和应变无损表征的核磁共振方法研究与开发

The New Method about Nondestructive Internal Microtomography to Semiconductors and IC

著录项

相似文献

相关主题

期刊订阅