Fracture behaviors of thin superconducting films with field-dependent critical current density

摘要

The fracture behaviors under electromagnetic force with field-dependent critical current density in thin superconducting film are investigated. Applying finite element method, the stress intensity factors of one central crack versus applied field and crack length are obtained for the exponential model, which was compared with the Bean model and Kim model. This work can offer good estimations and provide a basis for interpretation of cracking and mechanical failure of HTS thin films in numerous real situations.