首页> 外文会议>12th EMAS regional workshop on electron probe microanalysis of materials today : Practical aspects >MITIGATING CHARGING AND BEAM DAMAGE IN EPMA OF NON-CONDUCTIVE MATERIALS
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MITIGATING CHARGING AND BEAM DAMAGE IN EPMA OF NON-CONDUCTIVE MATERIALS

机译:非导电材料EPMA中的减缓充电和电子束损坏

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摘要

The characterisation of insulating materials has been a major application of EPMA for the past six decades. A review of the effects of charging and beam damage on non-conductive materials is presented. The charging condition needs to be considered not only in terms of the effects of a conductive coating but also in the sub-surface charging within the sample. Beam damage may be considered the effects of thermal decomposition; element migration and speciation change. The use of different coating materials, cryogenic stage and anti-contaminators permit a degree of mitigation of some of the damaging effects.
机译:在过去的六十年中,绝缘材料的表征一直是EPMA的主要应用。介绍了电荷和电子束损坏对非导电材料的影响。不仅需要根据导电涂层的影响来考虑充电条件,还需要考虑样品内的次表面充电。光束损伤可以认为是热分解的影响。元素迁移和物种变化。使用不同的涂层材料,低温阶段和抗污染剂可以一定程度地减轻某些破坏作用。

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