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Yield, Overall Test Environment Timing Accuracy, and Defect Level Trade-offs forHigh-Speed Interconnect Device Testing

机译：高速互连设备测试的良率，总体测试环境时序精度和缺陷级别的折衷

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《12th Asian test symposium 》|2003年|348-353|共6页
会议地点 Xian(CN);Xian(CN)
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正文语种 eng
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1. A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices [J] . BAOSHENG WANG, ANDY KUO, TOURAJ FARAHMAND, Journal of Electronic Testing: Theory and Applications: Theory and Applications . 2005 ,第6期

机译：现实的时序测试模型及其在高速互连设备中的应用
2. A placebo-controlled study to assess standardized field sobriety tests performance during alcohol and cannabis intoxication in heavy cannabis users and accuracy of point of collection testing devices for detecting thc in oral fluid [J] . BoskerW.M., TheunissenE.L., ConenS., Psychopharmacology . 2012 ,第4期

机译：一项安慰剂对照研究，用于评估重度大麻使用者酒精和大麻中毒期间的标准化现场清醒试验性能以及用于检测口腔液中thc的收集点测试设备的准确性
3. A placebo-controlled study to assess Standardized Field Sobriety Tests performance during alcohol and cannabis intoxication in heavy cannabis users and accuracy of point of collection testing devices for detecting THC in oral fluid [J] . W. M. Bosker, E. L. Theunissen, S. Conen, Psychopharmacology . 2012 ,第4期

机译：一项安慰剂对照研究，用于评估重度大麻使用者酒精和大麻中毒期间的标准现场清醒试验性能以及用于检测口腔液中THC的收集点测试设备的准确性
4. Yield, Overall Test Environment Timing Accuracy, and Defect Level Trade-offs for High-Speed Interconnect Device Testing [C] . Baosheng Wang, Yong B. Cho, Sassan Tabatabaei, 12th Asian test symposium . 2003

机译：高速互连设备测试的良率，总体测试环境时序精度和缺陷级别的折衷
5. Cost reduction and test-quality control for scan-based testing of statistical timing defect. [D] . Chao, Mango Chia-Tso. 2006

机译：用于基于扫描的统计时序缺陷测试的成本降低和测试质量控制。
6. A placebo-controlled study to assess Standardized Field Sobriety Tests performance during alcohol and cannabis intoxication in heavy cannabis users and accuracy of point of collection testing devices for detecting THC in oral fluid [O] . W. M. Bosker, E. L. Theunissen, S. Conen, -1

机译：安慰剂对照研究用于评估重度大麻使用者酒精和大麻中毒期间的标准化现场清醒试验性能以及用于检测口腔液中THC的收集点测试设备的准确性
7. Yield, Overall Test Environment Timing Accuracy, and Defect Level Trade-offs for High-Speed Interconnect Device Testing [O] . Baosheng Wang, Yong B. Cho, Sassan Tabatabaei, 2011

机译：高速互连器件测试的良率，整体测试环境时序精度和缺陷级别权衡
8. Correlation of Wafer Level QA Tests with Functional Device Yield and AcceleratedLife Test Results [R] . Tyree, V. C. 1995

机译：晶圆级Qa测试与功能器件产量和acceleratedLife测试结果的相关性

Yield, Overall Test Environment Timing Accuracy, and Defect Level Trade-offs forHigh-Speed Interconnect Device Testing

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