首页> 外文会议>12th Annual Pan Pacific Microelectronics Symposium amp; Tabletop Exhibition: International Technical Interchange >65nm FCBGA RELIABILITY FOR NEXT GENERATION GAMING DEVICE PHASE I-A METHODOLOGY FOR STREAMLINE PRODUCT DESIGN CYCLE AND 2nd AND SYSTEM LEVEL QUALIFICATION
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65nm FCBGA RELIABILITY FOR NEXT GENERATION GAMING DEVICE PHASE I-A METHODOLOGY FOR STREAMLINE PRODUCT DESIGN CYCLE AND 2nd AND SYSTEM LEVEL QUALIFICATION

机译:下一代游戏设备I相的65nm FCBGA可靠性-流线型产品设计周期以及第二级和系统级认证的方法

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摘要

In this study, a product specific technical consortium is initiated by voluntary participants, including OEM, Chip Supplier, Soldering Material and Fab Supplier, EMS, and Metallurgical/Failure Analytical Lab to study the FCBGA thermal and mechanical reliability. A 65nm FCBGA with electrical daisy chain and thermal die is included in a Test Vehicle (TV) and Box Emulator (BE). To facilitate and streamline the design development cycle, a closed loop Design for Reliability model is proposed.
机译:在这项研究中,由自愿参与者(包括OEM,芯片供应商,焊接材料和晶圆供应商,EMS和冶金/故障分析实验室)发起了一个产品特定的技术联盟,以研究FCBGA的热和机械可靠性。测试车(TV)和Box Emulator(BE)中包含具有电子菊花链和散热芯片的65nm FCBGA。为了促进和简化设计开发周期,提出了闭环可靠性设计模型。

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