首页> 外文会议>10th International Conference on Advances in Power System Control, Operation amp; Management >Hardware-in-the-loop (HIL) test of demand as frequency controlled reserve (DFR)
【24h】

Hardware-in-the-loop (HIL) test of demand as frequency controlled reserve (DFR)

机译:需求作为频率控制储备(DFR)的硬件在环(HIL)测试

获取原文
获取原文并翻译 | 示例

摘要

This paper presents the hardware-in-the-loop (HIL) test of the demand as frequency controlled reserve (DFR). The HIL test refers to a test in which parts of a pure simulation have been replaced by actual physical components. It is used to understand the behavior of a new device or controller. The DFR has been tested by offline simulations to illustrate the efficacy of this technology. The DFR control logics have been implemented in the SmartBox. The HIL was conducted by having the SmartBox connected to the real time simulations and the performance of the SmartBox was tested with difference frequency events in the simulated power systems. The HIL test results show that the implemented DFR in the SmartBox can efficiently arrest the system frequency.
机译:本文提出了对需求的硬件在环(HIL)测试,作为频率控制储备(DFR)。 HIL测试是指将纯模拟的部分替换为实际物理组件的测试。它用于了解新设备或控制器的行为。 DFR已通过离线模拟测试,以说明该技术的有效性。 DFR控制逻辑已在SmartBox中实现。通过将SmartBox连接到实时仿真来进行HIL,并在仿真电源系统中通过不同频率事件测试SmartBox的性能。 HIL测试结果表明,SmartBox中实现的DFR可以有效地抑制系统频率。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号