首页> 外文会议>10th IMEKO symposium : Laser metrology for precision measurement and inspection in industry (LMPMI) 2011 >Deflectometric Measurement of Flat and Slightly Curved Optical Surfaces with Improved Lateral Resolution
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Deflectometric Measurement of Flat and Slightly Curved Optical Surfaces with Improved Lateral Resolution

机译:具有改进的横向分辨率的平面和微弯曲光学表面的偏折测量

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At the Physikalisch-Technische Bundesanstalt (PTB), a new Deflectometric Flatness Reference (DFR) for measuring the topography of flat or slightly curved optical surfaces has recently been installed [1-4]. With existing deflectometric procedures like the direct or difference mode, the spot size of the angle measuring system (autocollimator) is the limiting factor for the lateral resolution. To reduce the spot size of the scanning beam, an additional measurement option, called Exact Autocollimation Deflectometric Scanning (EADS) is implemented. The surface under test is tilted at each measuring position to be perpendicular to the incoming light beam, and the tilt is measured by an additional autocollimator. The development of an angle measuring device with reduced spot size is explained. The development of the EADS system is detailed and the system will be compared with the classical deflectometric measurements.
机译:最近,在德国物理技术联合会(PTB)上,安装了一种新的折光平坦度参考(DFR),用于测量平坦或稍微弯曲的光学表面的形貌[1-4]。使用现有的折光测量程序(例如直接模式或差模),角度测量系统(自动准直仪)的光斑尺寸是横向分辨率的限制因素。为了减小扫描光束的光斑尺寸,实施了另一个测量选项,称为精确自准直偏转扫描(EADS)。被测表面在每个测量位置倾斜,以垂直于入射光束,并且倾斜由一个附加的自动准直仪测量。说明了具有减小的光斑尺寸的角度测量装置的发展。详细介绍了EADS系统的开发,并将该系统与经典的偏转测量进行比较。

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