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INSPECTION DEVICE, INSPECTION METHOD, MACHINE LEARNING DEVICE, AND MACHINE LEARNING METHOD

机译:检验设备、检验方法、机器学习设备和机器学习方法

摘要

PROBLEM TO BE SOLVED: To improve the accuracy of mold appearance inspection.;SOLUTION: An inspection device (1) includes one or more processors that perform an inspection step of inspecting an appearance of a mold (9) using a trained model (LM) constructed by machine learning. Input of the trained model (LM) includes an inspection image obtained by capturing an image of the appearance of the mold (9). Output of the trained model (LM) is information indicating an inspection result of the appearance of the mold (9).;SELECTED DRAWING: Figure 1
机译:

著录项

  • 公开/公告号JP2022102666A

    专利类型

  • 公开/公告日2022-07-07

    原文格式PDF

  • 申请/专利权人 SINTOKOGIO LTD;

    申请/专利号JP20200217535

  • 发明设计人 SUGINO TAKEHIRO;SONOHARA TAKESHI;

    申请日2020-12-25

  • 分类号G01N21/88;G06T7;

  • 国家

  • 入库时间 2023-06-26 00:00:43

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