首页> 外国专利> Separate inter-die connectors for data and error correction information and related systems, methods, and apparatuses

Separate inter-die connectors for data and error correction information and related systems, methods, and apparatuses

机译:单独inter-die连接器用于数据和错误正确的信息和相关系统,方法和设备

摘要

Separate inter-die connectors for data and error correction information and related systems, methods, and devices are disclosed. An apparatus includes a master die, a target die including data storage elements, inter-die data connectors, and inter-die error correction connectors. The inter-die data connectors electrically couple the master die to the target die. The inter-die data connectors are configured to conduct data between the master die and the target die. The inter-die error correction connectors electrically couple the master die to the target die. The inter-die error correction connectors are separate from the inter-die data connectors. The inter-die error correction connectors are configured to conduct error correction information corresponding to the data between the master die and the target die.
机译:

著录项

  • 公开/公告号US11366772B2

    专利类型

  • 公开/公告日2022-06-21

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US202016819914

  • 发明设计人 VIJAYAKRISHNA J. VANKAYALA;

    申请日2020-03-16

  • 分类号G06F13/16;G06F11/10;H01L25/065;

  • 国家

  • 入库时间 2024-06-14 23:16:58

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