首页> 外国专利> Apparatuses and methods using negative voltages in part of memory write, read, and erase operations

Apparatuses and methods using negative voltages in part of memory write, read, and erase operations

机译:使用负电压的设备和方法记忆写的一部分,阅读,和擦除操作

摘要

Some embodiments include apparatuses and methods having a memory cell string that can include memory cells located in different levels of the apparatus. The memory cell string can include a body associated with the memory cells. At least one of such embodiments can include a module configured to apply a negative voltage to at least a portion of the body of the memory cell string during an operation of the apparatus. The operation can include a read operation, a write operation, or an erase operation. Other embodiments are described.
机译:

著录项

  • 公开/公告号US11367486B2

    专利类型

  • 公开/公告日2022-06-21

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US201816228428

  • 发明设计人 KOJI SAKUI;

    申请日2018-12-20

  • 分类号G11C16;G11C16/04;G11C16/34;

  • 国家

  • 入库时间 2023-06-25 23:45:02

相似文献

  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号