首页> 外国专利> PHASE-SHIFTING PHASE MEASUREMENT ERROR CORRECTION METHOD BASED ON PIXEL TRACING OF OBJECT RASTER IMAGES

PHASE-SHIFTING PHASE MEASUREMENT ERROR CORRECTION METHOD BASED ON PIXEL TRACING OF OBJECT RASTER IMAGES

机译:基于目标光栅图像像素跟踪的相移相位测量误差校正方法

摘要

Disclosed is a phase-shifting phase measurement error correction method based on pixel tracing of object raster images. During traditional phase-shifting shape measurement, surface height information is represented by phase information. The nonlinearity of equipment inevitably causes errors of phase information calculated according to images captured by a camera. The method comprises: projecting, by projector, a special raster projection to resolve a pixel-tracing mapping relation; in a direction against a light path, determining the position of a point light source that illuminates any one image pixel in a captured image and is located in an imaging plane of the projector according to the pixel-tracing mapping relation; and finally, replacing distributed phase information in image pixels with ideal phases in point light sources to correct phase errors to improve the accuracy of phase-shifting shape measurement. Compared with existing methods, the method is easy to operate and high in efficiency and precision.
机译:本发明公开了一种基于对象光栅图像像素跟踪的相移相位测量误差校正方法。在传统的相移形状测量中,表面高度信息由相位信息表示。设备的非线性不可避免地会导致根据摄像机拍摄的图像计算相位信息的误差。该方法包括:通过投影仪投影特殊的光栅投影,以解决像素跟踪映射关系;在与光路径相反的方向上,根据像素跟踪映射关系确定点光源的位置,该点光源照亮捕获图像中的任何一个图像像素,并且位于投影仪的成像平面中;最后,用点光源中的理想相位代替图像像素中的分布相位信息来校正相位误差,以提高相移形状测量的精度。与现有方法相比,该方法操作简便、效率高、精度高。

著录项

  • 公开/公告号US2022107173A1

    专利类型

  • 公开/公告日2022-04-07

    原文格式PDF

  • 申请/专利权人 ZHEJIANG UNIVERSITY;

    申请/专利号US201917279079

  • 发明设计人 ZAIXING HE;XINYUE ZHAO;PEILONG LI;

    申请日2019-12-27

  • 分类号G01B11/25;

  • 国家 US

  • 入库时间 2022-08-25 00:23:16

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