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Diode fault analysis device and method of solar module using solar simulator

机译:基于太阳模拟器的太阳能组件二极管故障分析装置及方法

摘要

The present invention is a solar simulator using a solar simulator that detects a faulty diode among a plurality of bypass diodes by irradiating different light intensities to a series structure consisting of three or four solar modules with an LED solar simulator to prevent accidents in advance. A diode failure analysis apparatus and method for an optical module, wherein a plurality of solar cells are connected in series and are divided into first to third zones, respectively, corresponding to the first to third zones of the solar module 1st to 3rd bypass diodes configured to be, and an LED solar simulator for selectively irradiating the same light source and different light sources to the first to third zones of the solar module according to set conditions, and the LED solar simulator An IV curve measuring unit measuring the IV curve of the first to third sections of the solar module through the light source irradiated through the It is characterized in that it is configured to include a determining unit for determining the faulty bypass diode among the first to third bypass diodes by calculating the IV curve of .
机译:本发明是一种使用太阳能模拟器的太阳能模拟器,该太阳能模拟器通过将不同的光强度照射到由三个或四个带有LED太阳能模拟器的太阳能模块组成的串联结构来检测多个旁路二极管中的故障二极管,以提前防止事故发生。一种用于光学模块的二极管故障分析设备和方法,其中多个太阳能电池串联连接,并分别划分为第一至第三区域,对应于太阳能模块的第一至第三区域,第一至第三旁路二极管配置为:,以及LED太阳能模拟器,用于根据设定条件选择性地将相同光源和不同光源照射到太阳能组件的第一至第三区域,LED太阳能模拟器是一个IV曲线测量单元,该IV曲线测量单元通过通过通过LED照射的光源测量太阳能模块的第一至第三部分的IV曲线,其特征在于,其配置为包括一个确定单元,用于通过计算第一至第三旁路二极管的IV曲线来确定第一至第三旁路二极管中的故障旁路二极管。

著录项

  • 公开/公告号KR20220039290A

    专利类型

  • 公开/公告日2022-03-29

    原文格式PDF

  • 申请/专利权人 주식회사 티엔이테크;

    申请/专利号KR1020200122248

  • 发明设计人 김원기;김지영;한경훈;

    申请日2020-09-22

  • 分类号H02S50;F21S9/03;F21V25/02;F21Y115/10;

  • 国家 KR

  • 入库时间 2022-08-25 00:16:58

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