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An Infrared-transmitting High-sensitivity Visible Light Detector and Preparation Method Thereof

机译:一种红外透射高灵敏度可见光探测器及其制备方法

摘要

The invention relates to an infrared-transmitting high-sensitivity visible light detector and its preparation method. The detector is composed of passivation layer (14), upper electrode (13), heterojunction (15), lower electrode (3), and intrinsic monocrystalline silicon substrate (2). The upper electrode (13) is the material that is electrically conductive and transparent to visible light and infrared light. The heterojunction (15) is divided into heterojunction upper layer (5) and heterojunction lower layer (4), wherein the upper heterojunction layer (5) is a nano film sensitive to visible light and capable of transmitting infrared ray, and the lower heterojunction layer (4) is intrinsic monocrystalline silicon. When visible light and infrared light pass through the upper electrode (13) and the heterojunction upper layer (5), the visible light excites electron-hole pairs in the heterojunction (15), which are collected by the upper and lower electrodes and flow out through longitudinally arranged metal columns, while infrared light passes through the whole detection structure, so that visible light can be detected without affecting infrared transmission. The distance between the electrode and the junction zone is very small, which can reduce the recombination rate of electron-hole pairs before reaching the electrode and improve the collection efficiency of photo-generated carriers. The structural design of longitudinal metal reduces light shielding and improves sensitivity.
机译:本发明涉及一种红外透射高灵敏度可见光探测器及其制备方法。探测器由钝化层(14)、上电极(13)、异质结(15)、下电极(3)和本征单晶硅衬底(2)组成。上电极(13)是导电且对可见光和红外光透明的材料。异质结(15)分为异质结上层(5)和异质结下层(4),其中上层异质结层(5)是对可见光敏感并能传输红外线的纳米薄膜,下层异质结层(4)是本征单晶硅。当可见光和红外光通过上电极(13)和异质结上层(5)时,可见光激发异质结(15)中的电子-空穴对,电子-空穴对被上下电极收集并通过纵向排列的金属柱流出,而红外光通过整个检测结构,这样就可以在不影响红外传输的情况下检测到可见光。电极与结区之间的距离很小,这可以降低电子-空穴对到达电极前的复合率,提高光生载流子的收集效率。纵向金属的结构设计减少了光屏蔽,提高了灵敏度。

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