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Pulse-modulated light measurement method, pulse-modulated light measurement program, and optical spectrum analyzer

机译:脉冲调制光测量方法,脉冲调制光测量程序,以及光谱分析仪

摘要

PROBLEM TO BE SOLVED: To reduce costs associated with measurement and setup work of a measurement system by reducing the number of devices to be used separately other than an optical spectrum analyzer when performing measurement including characteristics in the time axis direction for pulse-modulated light as a measurement target. Make it easy. By controlling the basic components of an optical spectrum analyzer and adding new functions, it is possible to measure the characteristics of pulse-modulated light in the time axis direction by the optical spectrum analyzer alone. The diffraction grating position of the optical tunable wavelength filter is adjusted to select the 0th-order diffracted light, and the processing S01 for all wavelength bands is performed. Further, the sampling timing tx is determined in the spectrum measurement process S02 based on the pulse-on time Ton and the pulse period Tp of the pulse-modulated light detected from the waveform, and the spectrum is measured. The waveform in the time axis direction and the spectral waveform in the frequency axis direction are displayed simultaneously on the same screen. [Selection diagram] Fig. 2
机译:需要解决的问题:在执行测量时,通过减少单独使用的设备(而非光谱分析仪)的数量,减少与测量系统的测量和设置工作相关的成本,包括作为测量目标的脉冲调制光在时间轴方向的特性。简单点。通过控制光谱分析仪的基本部件并添加新功能,可以单独通过光谱分析仪测量脉冲调制光在时间轴方向上的特性。调整光学可调谐波长滤波器的衍射光栅位置以选择0阶衍射光,并对所有波段执行处理S01。此外,在频谱测量过程S02中,基于从波形检测到的脉冲调制光的脉冲接通时间Ton和脉冲周期Tp来确定采样定时tx,并且测量频谱。时间轴方向的波形和频率轴方向的频谱波形同时显示在同一屏幕上。[选择图]图2

著录项

  • 公开/公告号JP2022033585A

    专利类型

  • 公开/公告日2022-03-02

    原文格式PDF

  • 申请/专利权人 アンリツ株式会社;

    申请/专利号JP20200137559

  • 发明设计人 山崎 智英;

    申请日2020-08-17

  • 分类号G01J3/28;G01J3/18;

  • 国家 JP

  • 入库时间 2022-08-24 23:56:18

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