首页> 外国专利> A method of determining a property of a particle in a fluid sample and/or a method of determining a contamination property in a fluid sample

A method of determining a property of a particle in a fluid sample and/or a method of determining a contamination property in a fluid sample

机译:一种测定流体样品中颗粒的性质的方法和/或确定流体样品中的污染性质的方法

摘要

According to the present invention, there is provided a method for determining the properties of particles in a fluid sample and/or a method for determining the contamination properties of a fluid sample, the method comprising: (a) depositing a metallic film on a surface of a substrate on said substrate providing a smooth metallic surface; (b) contacting the fluid sample with the metallic surface of a substrate; (c) removing the fluid sample in contact with the metallic surface from the metallic surface so that only particles that were in the fluid sample remain on the metallic surface of the substrate; (d) depositing a layer of metal on the metallic surface and the particles remaining on the metallic surface of the substrate, each said particle being provided with a separate metallic layer, and regions of said metallic surface free of particles being provided with a metallic layer wherein for each particle there is a gap between the metallic layer on the particle and the metallic layer on the metallic surface; (e) illuminating the layer of metal on the particle and metallic surface with electromagnetic radiation, wherein the electromagnetic radiation is scattered by the layer of metal on the particle to produce individually scattered electromagnetic radiation; or illuminating the layer of metal on the particle and metallic surface with electromagnetic radiation, such that at least a portion of the electromagnetic radiation is absorbed by the layer of metal on the particle and another portion of the electromagnetic radiation strikes the metallic surface on the substrate. generating reflected electromagnetic rays by being reflected by the; (f) receiving electromagnetic radiation scattered from the array of photodiodes; or receiving reflected electromagnetic radiation from the array of photodiodes; (g) forming an image comprising pixels, wherein each pixel in the image corresponds to an individual photodiode in the array and the brightness of each pixel in the image is determined by the electromagnetic radiation received by the photodiode corresponding to the pixel. A step that corresponds to the intensity of; and (h) processing the formed image to determine a characteristic of the particle and/or processing the formed image to determine a contamination characteristic of the fluid sample.
机译:根据本发明,提供了一种用于确定流体样品中颗粒的性质的方法和/或用于确定流体样品的污染性质的方法,该方法包括:(a)在表面上沉积金属膜在所述基板上的基板提供光滑的金属表面; (b)将流体样品与基材的金属表面接触; (c)从金属表面去除与金属表面接触的流体样品,使得在流体样品中的颗粒保持在基板的金属表面上; (d)在金属表面上沉积一层金属和残留在基板的金属表面上的颗粒,每个所述颗粒设置有单独的金属层,并且所述金属表面的区域不含颗粒具有金属层的颗粒其中对于每个颗粒,在颗粒上的金属层与金属表面上的金属层之间存在间隙; (e)用电磁辐射照射颗粒上的金属层和金属表面,其中电磁辐射由颗粒上的金属层散射,以产生单独散射的电磁辐射;或者用电磁辐射照射颗粒上的金属层和金属表面,使得电磁辐射的至少一部分被颗粒上的金属层吸收,并且另一部分电磁辐射撞击基板上的金属表面。通过被反射产生反射的电磁光线; (f)从光电二极管阵列散射的电磁辐射;或从光电二极管阵列接收反射电磁辐射; (g)形成包括像素的图像,其中图像中的每个像素对应于阵列中的各个光电二极管,并且图像中的每个像素的亮度由由对应于像素对应的光电二极管接收的电磁辐射来确定。对应于强度的步骤; (h)处理形成的图像以确定颗粒的特性和/或处理形成的图像以确定流体样品的污染特性。

著录项

  • 公开/公告号KR20220005439A

    专利类型

  • 公开/公告日2022-01-13

    原文格式PDF

  • 申请/专利权人 유니서스 리미티드;

    申请/专利号KR1020217031519

  • 发明设计人 월터 파비안;

    申请日2019-05-13

  • 分类号G01N15/02;G01N1/28;G01N15/06;

  • 国家 KR

  • 入库时间 2022-08-24 23:27:26

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