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Design System For Test Adaptor Card And Method Thereof

机译:测试适配卡的设计系统及其方法

摘要

A design system for a test adapter card is provided. The circuitry to be tested on a motherboard is divided to form multiple modules to be tested, each of which corresponds to an interface to be tested. According to specifications of preset interfaces, the preset interface corresponding to each interface to be tested is selected, wherein the specifications of the preset interfaces conform to connector specifications of commercially available cables, multiple preset pins included in the selected preset interface completely cover the pins to be tested included in the corresponding interface to be tested, and the number of the preset pins included in the selected preset interface is greater than or equal to the number of the pins to be tested included in the corresponding interface to be tested. Design information required for producing the test adapter card is output based on the selection result and the division result.
机译:提供测试适配器卡的设计系统。 要在主板上进行测试的电路被分开以形成要测试的多个模块,每个模块对应于要测试的接口。 根据预设界面的规格,选择对应于要测试的每个接口的预设接口,其中预设接口的规格符合市售电缆的连接器规格,所选预设接口中包括的多个预设引脚完全覆盖销钉 被测在要测试的相应接口中被测试,所选的预设接口中包括的预设引脚的数量大于或等于要测试的相应接口中的要测试的引脚的数量。 基于选择结果和划分结果输出生产测试适配器卡所需的设计信息。

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