首页> 外国专利> TERAHERTZ SENSOR CHIP INCLUDING SPLIT RING RESONATOR AND TERAHERTZ SAMPLE ANALYZING DEVICE USING THE SAME

TERAHERTZ SENSOR CHIP INCLUDING SPLIT RING RESONATOR AND TERAHERTZ SAMPLE ANALYZING DEVICE USING THE SAME

机译:太赫兹传感器芯片包括使用相同的分流环谐振器和太赫兹样品分析装置

摘要

The present invention relates to a terahertz sensor chip including a split ring resonator and an apparatus for analyzing a terahertz sample using the same. The apparatus for analyzing a terahertz sample according to the present invention includes: a dielectric substrate generating a terahertz wave when a laser beam is irradiated; a first metal ring pattern and a second metal ring pattern provided on a surface of the dielectric substrate; a reference sample reservoir provided on a surface of the dielectric substrate inside the first metal ring pattern and into which a reference sample is injected; and a terahertz sensor chip provided on a surface of the dielectric substrate inside the second metal ring pattern and including an analysis target sample storage unit into which the analysis target sample is injected; a laser beam generator that generates a laser beam that excites terahertz waves; The laser beam generated by the laser beam generator is divided into a first laser beam irradiated to the reference sample reservoir and a second laser beam irradiated to the analysis target sample reservoir, and the first laser beam and the second laser an optical system for exciting a first terahertz wave and a second terahertz wave by irradiating a beam to the reference sample reservoir and the analyte sample reservoir, respectively; A reference sample signal is generated from the first terahertz wave passing through the reference sample in the reference sample reservoir, and an analysis sample signal is generated from the second terahertz wave passing through the analyte sample in the analysis target sample reservoir a detection unit; and a controller that controls the laser beam generator and the optical system, and compares the reference sample signal with the analysis sample signal.
机译:本发明涉及一种太赫兹传感器芯片,包括分流环谐振器和用于使用相同分析太赫兹样品的装置。根据本发明的用于分析太赫兹样品的装置包括:当照射激光束时产生太赫兹波的介电基板;第一金属环图案和设置在介电基板的表面上的第二金属环图案;在第一金属环图案内的介电基板的表面上设置有参考样品储存器,并注入参考样品;设置在第二金属环图案内的介电基板的表面上的太赫兹传感器芯片,并且包括注入分析目标样品的分析目标样品存储单元;一种激光束发电机,产生激光束,其激发太赫兹波浪;由激光束发电机产生的激光束被分成照射到参考样品储存器的第一激光束和照射到分析目标样品储存器的第二激光束,以及第一激光束和第二激光用于令人兴奋的光学系统通过照射到参考样品贮存器和分析物样品储层的第一太赫兹波和第二太赫兹波。从通过参考样品储存器中的参考样品的第一个太赫兹波产生参考样品信号,并且通过在分析目标样品储存器中通过分析物样品的第二太赫兹波产生分析样本信号;和控制激光束发生器和光学系统的控制器,并将参考样本信号与分析样本信号进行比较。

著录项

  • 公开/公告号KR102340189B1

    专利类型

  • 公开/公告日2021-12-15

    原文格式PDF

  • 申请/专利权人 서울시립대학교 산학협력단;

    申请/专利号KR20200113397

  • 发明设计人 손주혁;이동건;

    申请日2020-09-04

  • 分类号G01N21/3581;G01N33/48;

  • 国家 KR

  • 入库时间 2022-08-24 22:49:19

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