Correcting clamping unit and apparatus of clamping hifix board for test handler having the same

摘要

A correction clamping unit provided in a test handler for clamping a high-fix board is disclosed. The correction clamping unit may include a guide clamper, a first clamper fixing member, a rotating rod, and a driving unit. The guide clamper clamps one side of the high-fix board and is provided rotatably to correct the bending of the high-fix board. The first clamper fixing member is rotatably coupled to the guide clamper, and fixes the position of the guide clamper. One end of the rotating rod is coupled to the guide clamper and transmits a rotational force to the guide clamper. The driving unit couples the rotating rod to be rotatable, and provides a rotational force to the rotating rod. As such, since the correction clamping unit includes a rotatable guide clamper to correct warpage of the high-fix board, poor contact between the high-fix board and semiconductor devices can be prevented and test reliability can be improved.