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NON-DESTRUCTIVE TESTING DEVICE AND NON-DESTRUCTIVE TESTING METHOD

机译:非破坏性测试设备和非破坏性测试方法

摘要

A non-destructive testing device (10) and a non-destructive testing method. The non-destructive testing device (10) comprises an excitation component (11), an acquisition component (12) and a probe (13), and the excitation component (11) is connected to the probe (13), and supplies energy to the probe (13); the probe (13) transmits a first signal to a workpiece (15) to be tested and receives a second signal corresponding to the first signal; the acquisition component (12) is connected to the probe (13), and acquires the first signal and the second signal from the probe (13); and the non-destructive testing device (10) further comprises a probe peripheral assembly (14), and the probe peripheral assembly (14) surrounds the probe (13), so that a first space that isolates the probe (13) from an external environment is formed at the periphery of the probe (13). The non-destructive testing device (10) is suitable for the simple and easy non-destructive testing of low-temperature environments and non-destructive testing of superconducting magnets.
机译:非破坏性测试装置(10)和非破坏性测试方法。非破坏性测试装置(10)包括激励分量(11),采集部件(12)和探针(13),并且激励组件(11)连接到探针(13),并将能量提供给探针(13);探针(13)将第一信号发送到待测工件(15)的工件(15),并接收与第一信号对应的第二信号;获取组件(12)连接到探针(13),并从探针(13)中获取第一信号和第二信号;并且非破坏性测试装置(10)还包括探针外围组件(14),并且探针外围组件(14)围绕探头(13),使得从外部隔离探头(13)的第一空间环境形成在探针的周边(13)。非破坏性测试装置(10)适用于低温环境的简单易破坏性测试和超导磁体的非破坏性测试。

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