首页>
外国专利>
NON-DESTRUCTIVE TESTING DEVICE AND NON-DESTRUCTIVE TESTING METHOD
NON-DESTRUCTIVE TESTING DEVICE AND NON-DESTRUCTIVE TESTING METHOD
展开▼
机译:非破坏性测试设备和非破坏性测试方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
A non-destructive testing device (10) and a non-destructive testing method. The non-destructive testing device (10) comprises an excitation component (11), an acquisition component (12) and a probe (13), and the excitation component (11) is connected to the probe (13), and supplies energy to the probe (13); the probe (13) transmits a first signal to a workpiece (15) to be tested and receives a second signal corresponding to the first signal; the acquisition component (12) is connected to the probe (13), and acquires the first signal and the second signal from the probe (13); and the non-destructive testing device (10) further comprises a probe peripheral assembly (14), and the probe peripheral assembly (14) surrounds the probe (13), so that a first space that isolates the probe (13) from an external environment is formed at the periphery of the probe (13). The non-destructive testing device (10) is suitable for the simple and easy non-destructive testing of low-temperature environments and non-destructive testing of superconducting magnets.
展开▼