Plate-shaped connection system for the connection of two test units, also connection unit and test system each with such a plate-shaped connection system

摘要

The present invention relates to a plate-shaped connection system for the connection of two test units, such as for example a testing device (tester) and a handling device (handler). The handling device serves for the feeding of semiconductor elements to the tester of a test system, for the testing of such semiconductor elements. The plate-shaped connection system comprises a master frame and an insert frame. The master frame is designed for connection with a first of the two test units and one or more docking elements are provided for releasable connection with the other second test unit. The insert frame is designed that it may be connected to the master frame. The insert frame extends inwards from an inner edge of the master frame, wherein the insert frame has mounting elements for the mounting of a test board.