Samples for observation with a transmission electron microscope, a method for producing the same, and a method for observing with a transmission electron microscope.

摘要

PROBLEM TO BE SOLVED: To easily prepare a sample having a flaky portion having a thickness and a viewing area suitable for observation / measurement by a TEM, which can be easily attached to a TEM even if the sample is in the form of a sheet or a scale. A method for preparing a sample for TEM observation, a sample for TEM observation, and a TEM observation method using the sample for TEM observation are provided. SOLUTION: A sample to be observed is trimmed to a size that fits in a hole of a sheet mesh 11, fixed with a filler 32 to obtain a cured sample, and the cured sample is irradiated with an argon ion beam to form a sheet mesh. A sample for observation with a transmission electron microscope and a method for producing the sample, in which the sample is sliced to a thickness suitable for observation with a transmission electron microscope while substituting the action of a shielding plate. [Selection diagram] FIG. 9