首页> 外国专利> SEMICONDUCTOR PROCESSING SYSTEM WITH IN-SITU ELECTRICAL BIAS AND METHODS THEREOF

SEMICONDUCTOR PROCESSING SYSTEM WITH IN-SITU ELECTRICAL BIAS AND METHODS THEREOF

机译:具有原位电偏置的半导体处理系统及其方法

摘要

A method of fabricating a semiconductor device includes placing a semiconductor wafer into a processing chamber, the semiconductor wafer including a first conductive layer and a second conductive layer separated by an intermediate layer; applying an electrical bias voltage across the intermediate layer by coupling the first conductive layer to a first potential and coupling the second conductive layer to a second potential; and annealing the semiconductor wafer while applying the electrical bias voltage.
机译:制造半导体器件的方法包括将半导体晶片放入处理室中,半导体晶片包括第一导电层和由中间层分开的第二导电层; 通过将第一导电层耦合到第一电位并将第二导电层耦合到第二电位,通过将电偏置电压施加到中间层两端。 在施加电偏压时和退火半导体晶片。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号