MULTI-BEAM MEASURING DEVICE FOR 3D SCANNING OF AN ENVIRONMENT HAVING MULTIPLE SEMICONDUCTOR LASER ARRAYS AND UNIFORM BEAM DISTRIBUTION

摘要

The present invention relates to a measurement device (1) for the three-dimensional geometric capture of an environment by means of a plurality of transmission beams, wherein the transmission unit comprises multiple semiconductor lasers arrays (7,7A,7B,7C), each semiconductor laser array comprising multiple laser emitters (12, 12A, 12B) made from a monolithic block. The multiple semiconductor laser arrays (7,7A,7B,7C) are arranged and configured, e.g. by using an optical beam splitting component and/or by shifting or rotating the semiconductor laser arrays with respect to each other, such that an outgoing beam pattern (40) is generated, wherein the angular distance between adjacent beams of the outgoing beam pattern (40) is in each case less than or equal to a given minimal angular distance provided by the pitch between adjacent laser emitters (12, 12A, 12B) of the same semiconductor laser array.