首页> 外国专利> Wide measurement range deformation measurement method and its program

Wide measurement range deformation measurement method and its program

机译:宽测量范围变形测量方法及其程序

摘要

To solve the problem of reproductivity and efficiency in a situation where two grids with different pitches have to be prepared and respectively photographed twice before/after deformation when phase connection is to be applied to a conventional monochrome grid.SOLUTION: One color grid is generated where red and blue grids with different pitches are plotted. Then, two gray scale images are obtained by separating color images respectively photographed once before/after deformation into a R (red) component and a B (blue) component with the use of a color digital camera. A phase difference is calculated from phase distributions before/after deformation of an expanded pitch obtained by performing phase connection of phase distributions having moire patterns with different pitches acquired from the two gray scale images. Then, a long measurement range displacement distribution is obtained.SELECTED DRAWING: Figure 3
机译:为了解决一种情况下,必须在将相位连接施加到传统的单色栅格的相位连接之前/之后拍摄具有不同间距的两个网格的情况下的生殖和效率的问题 绘制了不同间距的红色和蓝色网格。 然后,通过使用彩色数码相机将分别拍摄一次/之后分别拍摄一次/之后的彩色图像,通过使用彩色数码相机来获得两种灰度图像。 从通过执行具有从两个灰度图像获取的不同间距的莫尔图案的相位分布而获得的扩展间距之前/之后的相位差计算相位差。 然后,获得了长测量范围位移分布。选择绘图:图3

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号