THz measuring device and THz measuring method for measuring test objects, especially pipes

摘要

The invention relates to a THz measuring device (2) for measuring a test object (8), in particular a pipe (8), with a first THz transceiver (3) which emits a first THz beam (10) with a first polarization plane along an optical Axis (A) through a measuring space (7) outputs a first polarization mirror (4) which is designed to return the first THz beam (10) through the measuring space (7) along the optical axis (A) to the to reflect the first THz transceiver (3), a second THz transceiver (5) which emits a second THz beam (11) which is polarized in a second polarization plane different from the first plane of polarization, in particular an orthogonal plane of polarization, a second polarization plane Mirror (6) which is designed to reflect the second THz beam (11) that has passed through the measurement space (7) along the optical axis (A) back through the measurement space (7) to the second transceiver (5), the THz rays through each other's buttocks larization mirror pass through without any significant influence, and the measurement signals (S1, S2) of the THz transceiver (3, 5) are related to one another in order to determine layer thicknesses (d1, d2) and / or a refractive index (n) of the test object (8 ) to investigate.