METHOD FOR AUTOMATED UNSUPERVISED ONTOLOGICAL INVESTIGATION OF STRUCTURAL APPEARANCES IN ELECTRON MICROGRAPHS

摘要

The method is for dividing dark objects, substructures and background of an image from an electron microscope into segments by analysing pixel values. The segments are transformed and aligned so that the transformed objects, sub-structures and background are meaningfully comparable. The transformed segments are clustered into classes which are used for ontological investigation of samples that are visualized by using electron microscopy. A triangle inequality comparison can be used to further cluster groups of objects to transfer understanding from different interactions between objects and to associate interactions with each other.