首页> 外国专利> METHOD FOR OPTICAL DISTANCE MEASURING FOR A LASER MACHINING PROCESS, MEASURING SYSTEM FOR OPTICAL DISTANCE MEASURING FOR A LASER MACHINING DEVICE AND LASER MACHINING DEVICE COMPRISING SAME

METHOD FOR OPTICAL DISTANCE MEASURING FOR A LASER MACHINING PROCESS, MEASURING SYSTEM FOR OPTICAL DISTANCE MEASURING FOR A LASER MACHINING DEVICE AND LASER MACHINING DEVICE COMPRISING SAME

机译:用于激光加工工艺的光学距离测量方法,用于激光加工装置的光学距离测量系统和包含该的激光加工装置的测量系统

摘要

The invention relates to a method for optical distance measuring for a laser machining process for machining workpieces (11, 12), said method comprising the following steps: directing an optical measuring beam (43) onto a workpiece surface (1); scanning the workpiece surface (1) with the optical measuring beam (43) along at least one measuring path (3, 3a, 3b, 3c); and determining distances to the workpiece surface (1) at a plurality of measuring points along the measuring path (3, 3a, 3b, 3c), wherein the determining of distances occurs with a first resolution in a first measuring region (31) of the measuring path (3, 3a, 3b, 3c) and with a second resolution in a second measuring region (32) of the measuring path (3, 3a, 3b, 3c), wherein the first resolution is higher than the second resolution.
机译:本发明涉及一种用于加工工件(11,12)的激光加工过程的光学距离测量方法,所述方法包括以下步骤:将光学测量光束(43)引导到工件表面(1)上; 沿着至少一个测量路径(3,3a,3b,3c)用光学测量梁(43)扫描工件表面(1); 在沿着测量路径(3,3a,3b,3c)的多个测量点处的工件表面(1)的距离和确定距离,其中在第一测量区域(31)中的第一分辨率在距离发生距离时发生的距离。 测量路径(3,3a,3b,3c)和在测量路径(3,3a,3b,3c)的第二测量区域(32)中的第二分辨率,其中第一分辨率高于第二分辨率。

著录项

  • 公开/公告号WO2021165390A1

    专利类型

  • 公开/公告日2021-08-26

    原文格式PDF

  • 申请/专利权人 PRECITEC GMBH & CO. KG;

    申请/专利号WO2021EP54017

  • 发明设计人 SAUER MATTHIAS;SCHWARZ JOACHIM;

    申请日2021-02-18

  • 分类号B23K26/03;B23K31;G01B9/02;G01B11/06;

  • 国家 EP

  • 入库时间 2022-08-24 20:50:23

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