首页> 外国专利> Wet clean solutions to prevent pattern collapse

Wet clean solutions to prevent pattern collapse

机译:湿干净的解决方案,以防止图案崩溃

摘要

A method for implementing a wet clean process includes cleaning one or more trenches formed in an interlevel dielectric by applying a two-phase cleaning solution. Applying the two-phase cleaning solution includes applying a first component of the two-phase cleaning solution including a diluted acid solution, and reducing capillary force during drying by applying a second component of the two-phase cleaning solution including a chemistry that is less dense than the first component.
机译:用于实现湿式清洁方法的方法包括通过施加两相清洁溶液清洁在间片电介质中形成的一个或多个沟槽。 施加两相清洁溶液包括施加包括稀酸溶液的两相清洁溶液的第一组分,并通过施加两相清洁溶液的第二个组分,减少了在干燥期间的毛细力,包括较小的化学 比第一个组成部分。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号