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X-ray backscatter system and method for detecting discrepancies in items
X-ray backscatter system and method for detecting discrepancies in items
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机译:X射线反向散射系统和用于检测物品差异的方法
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摘要
A method for detecting discrepancies in an item is provided. The method comprises: directing energy waves at the item along at least one dimension, wherein a portion of the energy waves are reflected back from the item; detecting reflected energy waves from the item along at least one dimension and recording the intensity of the detected reflected energy waves, and forming a one-dimensional image of the item from the detected reflected energy waves.
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