Power supply, automated test equipment, power operation method, automatic test equipment operation method and computer program using voltage fluctuation compensation mechanism

摘要

The power supply is configured to perform at least partial compensation of voltage fluctuations due to load changes using a voltage fluctuation compensation mechanism that is triggered in response to an expected change in load. An automated test rig for testing the device under test includes a power source configured to supply the device under test. The automated test rig includes a pattern generator configured to provide one or more stimulus signals to the device under test. The power source is configured to perform at least partial compensation of voltage fluctuations due to load changes using a voltage fluctuation compensation mechanism synchronized with one or more of the stimulus signals and/or activated in response to one or more response data signals from the device under test. . Corresponding methods and computer programs are also described.