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SPIN ORBIT TORQUE MAGNETORESISTIVE RANDOM ACCESS MEMORY CONTAINING COMPOSITE SPIN HALL EFFECT LAYER INCLUDING BETA PHASE TUNGSTEN
SPIN ORBIT TORQUE MAGNETORESISTIVE RANDOM ACCESS MEMORY CONTAINING COMPOSITE SPIN HALL EFFECT LAYER INCLUDING BETA PHASE TUNGSTEN
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机译:旋转轨道扭矩磁阻随机存取存储器,其中包含复合旋转霍尔效应层,包括β相钨
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摘要
A spin orbit torque magnetoresistive random access memory (SOT MRAM) cell includes a magnetic tunnel junction that contains a free layer having two bi-stable magnetization directions, a reference magnetic layer having a fixed magnetization direction, and a tunnel barrier layer located between the free layer and the reference layer, and a nonmagnetic spin Hall effect layer. The spin Hall effect layer may include an alternating stack of beta phase tungsten layers and noble metal nonmagnetic dusting layers. Alternatively or in addition, a hafnium layer may be located between the nonmagnetic spin Hall effect layer and the free layer.
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