LWIR IMAGING SYSTEM FOR DETECTING AN AMORPHOUS AND/OR CRYSTALLINE STRUCTURE OF PHOSPHATE AND/OR SULPHATE SALTS ON THE SURFACE OF A SUBSTRATE OR WITHIN A SUBSTRATE AND USE OF THE LWIR IMAGING SYSTEM

摘要

The present invention refers to a LWIR imaging system for detecting an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of a substrate or within a substrate comprising an infrared light emitting source (A) that emits over the whole range of 8 to 14 µm, an LWIR detecting device (B), and a ToF distance sensor (C), as well as to the use of such a LWIR imaging system.