A high-frequency pattern interference-based binary grating image projection reflection suppression method. The method comprises: generating a plurality of high-frequency patterns for reflection suppression; generating a binary grating for three-dimensional topography measurement, and performing a negation operation on the binary grating to generate a negative binary grating; generating a plurality of coherent binary gratings, the coherent binary gratings being obtained by performing interference operations on coded values in the high-frequency patterns and coded values in the binary grating/negative binary grating; and performing projection by a projector (1) and then taking projection images of the plurality of coherent binary gratings collected by a camera (2) as output images, and performing synthesis processing on all the output images in a specific manner to obtain an output image subjected to reflection suppression, i.e., a result of a binary grating image to be projected after reflection suppression. According to the method, a false measurement result caused by reflection in binary grating projection method-based three-dimensional measurement is effectively eliminated, and binary grating projection method-based three-dimensional topography measurement precision is improved.
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