AN INVENTION PATTERN ANALYSIS SYSTEM USING PATENT CLASSIFICATION CODES AND METHOD OF ANALYZING INVENTION PATTERNS USING THE PATENT CLASSIFICATION CODE

摘要

The present invention relates to an invention pattern analysis system using a patent classification code and an invention pattern analysis method using the same, and more specifically, a representative technology of each applicant's invention using the International Patent Classification Code (IPC) and Advanced Patent Classification (CPC). By extracting , it is possible to provide an invention pattern analysis system and an invention pattern analysis method using the patent classification code that can easily grasp the trend of invention technology and establish an efficient patent strategy. In addition, in the invention pattern analysis system using the patent classification code, a search terminal receiving applicant information and the applicant information received from the search terminal are used to analyze the trend based on the applicant's technical invention using the patent classification code And it is an invention pattern analysis system using a patent classification code including a main server for extracting a representative technology.